F. Jiménez-Villacorta, J. A. Gallastegui, I. Fina, X. Marti, and J. Fontcuberta Phys. Rev. B 86, 024420 (2012)
We combine x-ray diffraction (XRD) and polarized x-ray absorption fine structure (EXAFS) experiments to quantify the bonding angle in YMnO3 thin films and its trend with increasing substrate induced epitaxial strain.
These structural data allows microscopic understranding of the dielectric and magentic properties
