J. Kreisel, M. C. Weber, P. A. Thomas, N. Dix, F. Sánchez, J. Fontcuberta
Adv. Funct. Mater. 26 July 2012
The integration of functional oxides on silicon requires the use of complex heterostructures whose properties strongly depend on the strain state.
We show that wavelength-dependent Raman scattering is well adapted to determine the strain state of individual layers in BaTiO3/LaNiO3/CeO2/YSZ structure on Silicon.