Advanced ferroelectric characterization

Ferroelectric characterization of oxide films is remarkably challenging. Many effects resulting from the ultrathin character of the material and the strain effects imposed by the selected substrate makes can produce unexpected and interesting results. In addition, the ferroelectric order can be largely influenced by light, presence of magnetic field and other external parameters.

We investigate on the ferroelectric properties of variety of ferroelectric oxide materials in thin film form (ferroelectric-HfO2, BaTiO3, REMnO3 and BiFeO3). Our focus is on the study of the relevant for applications ferroelectric properties of these materials. In addition, the high quality of the materials developed in our lab allow to investigate the intrinsic properties of the materials. In addition, we are also interested on the interaction of ferroelectric order with light and magnetic field.

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